Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Hybrid pattern recognition using Markov networks
Gregor, J.   Thomason, M.G.  
Inst. of Electron. Syst., Aalborg Univ.;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jun 1993
Volume: 15,  Issue: 6
On page(s): 651-656
ISSN: 0162-8828
References Cited: 19
CODEN: ITPIDJ
INSPEC Accession Number: 4465232
Digital Object Identifier: 10.1109/34.216736
Current Version Published: 2002-08-06

Abstract
Markov networks are inferred automatically for different classes of learning strings. In subsequent string-to-network alignments for test samples, the networks are used to deduce structural characteristics and to provide similarity measures. By processing the similarity measures as numerical-value features, standard nonparametric decision-theoretic pattern classifiers may be applied to determine class membership. The nearest-neighbor rule and linear discriminant-function classifiers are discussed, and their performances are compared with that of a maximum-likelihood classifier. The hybrid system's ability to determine string orientation correctly is investigated. Experiments with several thousand human banded chromosomes are reported

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (540 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved