Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Image sequence enhancement using sub-pixel displacements
Keren, D.   Peleg, S.   Brada, R.  
Dept. of Comput. Sci., Hebrew Univ., Jerusalem ;

This paper appears in: Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Publication Date: 5-9 Jun 1988
On page(s): 742-746
Meeting Date: 06/05/1988 - 06/09/1988
Location: Ann Arbor, MI, USA
ISBN: 0-8186-0862-5
References Cited: 10
INSPEC Accession Number: 3258580
Digital Object Identifier: 10.1109/CVPR.1988.196317
Current Version Published: 2002-08-06

Abstract
Given a sequence of images taken from a moving camera, they are registered with subpixel accuracy in respect to translation and rotation. The subpixel registration allows image enhancement with respect to improved resolution and noise cleaning. Both the registration and the enhancement procedures are described. The methods are particularly useful for image sequences taken from an aircraft or satellite where images in a sequence differ mostly by translation and rotation. In these cases, the process results in images that are stable, clean, and sharp

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (548 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved