On image analysis by the methods of moments
Teh, C.-H.
Chin, R.T.
Dept of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI;
This paper appears in: Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Publication Date: 5-9 Jun 1988
On page(s): 556-561
Meeting Date: 06/05/1988 - 06/09/1988
Location: Ann Arbor, MI, USA
ISBN: 0-8186-0862-5
References Cited: 10
INSPEC Accession Number: 3258557
Digital Object Identifier: 10.1109/CVPR.1988.196290
Current Version Published: 2002-08-06
Abstract
Various types of moments have been used to recognize image
patterns in a number of applications. The authors evaluate a number of
moments and addresses some fundamental questions, such as image
representation ability, noise sensitivity, and information redundancy.
Moments considered include regular moments, Legendre moments, Zernike
moments, pseudo-Zernike moments, rotational moments and complex moments.
Properties of these moments are examined in detail, and the
interrelationships among them are discussed. Both theoretical and
experimental results are presented
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