Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Surface classification: hypothesis testing and parameter estimation
Flynn, P.J.   Jain, A.K.  
Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI;

This paper appears in: Computer Vision and Pattern Recognition, 1988. Proceedings CVPR '88., Computer Society Conference on
Publication Date: 5-9 Jun 1988
On page(s): 261-267
Meeting Date: 06/05/1988 - 06/09/1988
Location: Ann Arbor, MI, USA
ISBN: 0-8186-0862-5
References Cited: 20
INSPEC Accession Number: 3258524
Digital Object Identifier: 10.1109/CVPR.1988.196246
Current Version Published: 2002-08-06

Abstract
A 3-D surface classification method based on the quadric surface model is described. This technique does not require the points from the surface to lie on a grid. A sample of surface points is classified as planar or nonplanar through two hypothesis tests. If the sample is nonplanar, curvature features are evaluated at each point to classify the sample as spherical, cylindrical, or conical. A nonlinear optimization technique is then used to refine the parameters (e.g. radius, orientation) of the resulting surface type

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (660 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved