Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An investigation of methods for determining depth from focus
Ens, J.   Lawrence, P.  
Intense Technologies, Richmond, Ont.;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Feb 1993
Volume: 15,  Issue: 2
On page(s): 97-108
ISSN: 0162-8828
References Cited: 32
CODEN: ITPIDJ
INSPEC Accession Number: 4396873
Digital Object Identifier: 10.1109/34.192482
Current Version Published: 2002-08-06

Abstract
The concept of depth from focus involves calculating distances to points in an observed scene by modeling the effect that the camera's focal parameters have on images acquired with a small depth of field. This technique is passive and requires only a single camera. The most difficult segment of calculating depth from focus is deconvolving the defocus operator from the scene and modeling it. Most current methods for determining the defocus operator employ inverse filtering. The authors reveal some fundamental problems with inverse filtering: inaccuracies in finding the frequency domain representation, windowing effects, and border effects. A general, matrix-based method using regularization is presented, which eliminates these problems. The new method is confirmed experimentally, with the results showing an RMS error of 1.3%

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (880 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved