Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

One-dimensional regularization with discontinuities
Lee, D.   Pavlidis, T.  
AT&T Bell Labs., Murray Hill, NJ;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Nov 1988
Volume: 10,  Issue: 6
On page(s): 822-829
ISSN: 0162-8828
References Cited: 28
CODEN: ITPIDJ
INSPEC Accession Number: 3322962
Digital Object Identifier: 10.1109/34.9105
Current Version Published: 2002-08-06

Abstract
Regularization is equivalent to fitting smoothing splines to the data so that efficient and reliable numerical algorithms exist for finding solutions. however, the results exhibit poor performance along edges and boundaries. To cope with such anomalies, a more general class of smoothing splines that preserve corners and discontinuities is studied. Cubic splines are investigated in detail, since they are easy to implement and produce smooth curves near all data points except those marked as discontinuities or creases. A discrete regularization method is introduced to locate corners and discontinuities in the data points before the continuous regularization is applied

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (584 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved