The canonical coordinates method for pattern deformation:theoretical and computational considerations
Segman, J.
Rubinstein, J.
Zeevi, Y.Y.
Technion-Israel Inst. of Technol., Haifa;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Dec 1992
Volume: 14,
Issue: 12
On page(s): 1171-1183
ISSN: 0162-8828
References Cited: 26
CODEN: ITPIDJ
INSPEC Accession Number: 4338692
Digital Object Identifier: 10.1109/34.177382
Current Version Published: 2002-08-06
Abstract
A method for the analysis of deformed patterns is presented and
analyzed. The image is transformed into a new set of coordinates in
which the deformation has a particular simple form. A number of
deformations are considered. The practical implementation of the method
is discussed. Similar aspects of biological vision are also considered
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