Surface parametrization and curvature measurement of arbitrary 3-Dobjects: five practical methods
Stokely, E.M.
Wu, S.Y.
Dept. of Biomed. Eng., Alabama Univ., Birmingham, AL;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Aug 1992
Volume: 14,
Issue: 8
On page(s): 833-840
ISSN: 0162-8828
References Cited: 30
CODEN: ITPIDJ
INSPEC Accession Number: 4246275
Digital Object Identifier: 10.1109/34.149594
Current Version Published: 2002-08-06
Abstract
Curvature sampling of arbitrary, fully described 3-D objects (e.g.
tomographic medical images) is difficult because of surface patch
parameterization problems. Five practical solutions are presented and
characterized-the Sander-Zucker approach, two novel methods based on
direct surface mapping, a piecewise linear manifold technique, and a
turtle geometry method. One of the new methods, called the cross patch
(CP) method, is shown to be very fast, robust in the presence of noise,
and is always based on a proper surface parameterization, provided the
perturbations of the surface over the patch neighborhood are
isotropically distributed
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