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SYMAN: a symmetry analyzer
Gross, A.D.   Boult, T.E.  
Dept. of Comput. Sci., Columbia Univ., New York, NY;

This paper appears in: Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Publication Date: 3-6 Jun 1991
On page(s): 744-746
Meeting Date: 06/03/1991 - 06/06/1991
Location: Maui, HI, USA
ISBN: 0-8186-2148-6
References Cited: 8
INSPEC Accession Number: 4137218
Digital Object Identifier: 10.1109/CVPR.1991.139810
Current Version Published: 2002-08-06

Abstract
A description is given of the construction of a symmetry analyzer. Examples using SYMAN on both real and synthetic images are shown. SYMAN's combination of both global and local methods is discussed. The derivation of a global analytic solution for the skew axes when the degree of skew symmetry is known is described. A local tangent-based algorithm which has advantages over previous methods is presented

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