Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A computational framework and SIMD algorithms for low-level supportof intermediate level vision processing
Herbordt, M.C.   Weems, C.C.   Scudder, M.J.  
Dept. of Comput. & Inf. Sci., Massachusetts Univ., Amherst, MA;

This paper appears in: Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Publication Date: 3-6 Jun 1991
On page(s): 740-741
Meeting Date: 06/03/1991 - 06/06/1991
Location: Maui, HI, USA
ISBN: 0-8186-2148-6
References Cited: 7
INSPEC Accession Number: 4137216
Digital Object Identifier: 10.1109/CVPR.1991.139808
Current Version Published: 2002-08-06

Abstract
The authors propose an additional level of parallelism, called multi-associativity, as a framework for simultaneously performing associative computation on data sets mapped to irregular, non-uniform, aggregates of processing elements (PEs). They introduce algorithms developed for the CAAPP to simulate efficiently within aggregates of PEs simultaneously the associative algorithms typically supported in hardware at the array level. Some of the results are: the efficient application of existing associative algorithms to arbitrary aggregates of PEs in parallel and the development of multi-associative algorithms, among them parallel prefix and convex hull. The multi-associative framework also extends the associative paradigm by allowing operation on and among aggregates themselves, operations not defined when the entity in question is always an entire array

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (176 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved