Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Deformable models: canonical parameters for surface representationand multiple view integration
Vermuri, B.C.   Malladi, R.  
Dept. of Comput. & Inf. Sci., Florida Univ., Gainesville, FL;

This paper appears in: Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Publication Date: 3-6 Jun 1991
On page(s): 724-725
Meeting Date: 06/03/1991 - 06/06/1991
Location: Maui, HI, USA
ISBN: 0-8186-2148-6
References Cited: 3
INSPEC Accession Number: 4137208
Digital Object Identifier: 10.1109/CVPR.1991.139800
Current Version Published: 2002-08-06

Abstract
Three-dimensional viewpoint invariance is an important requirement in the representation of surfaces for recognition tasks. Parameterized surfaces possess this desirable property. In general, the parameters in a parametric surface representation can be arbitrarily defined. A canonical, intrinsic parameterization provides a consistent, invariant form for describing surfaces. The goal of this work is to define and construct such a parameterization

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (152 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved