Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Closed-form solutions for physically-based shape modeling andrecognition
Sclaroff, S.   Pentland, A.  
Media Lab., MIT, Cambridge, MA;

This paper appears in: Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Publication Date: 3-6 Jun 1991
On page(s): 238-243
Meeting Date: 06/03/1991 - 06/06/1991
Location: Maui, HI, USA
ISBN: 0-8186-2148-6
References Cited: 13
INSPEC Accession Number: 4132431
Digital Object Identifier: 10.1109/CVPR.1991.139695
Current Version Published: 2002-08-06

Abstract
An efficient, physically based solution for recovering a 3-D solid model from collections of 3-D surface measurements is presented. Given a sufficient number of independent measurements, the solution is overconstrained and unique except for rotational symmetries. A physically based object recognition method that allows simple, closed-form comparisons of recovered 3-D solid models is given. The performance of these methods is evaluated using both synthetic and real laser rangefinder data

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (544 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved