Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Sampling and reconstruction with adaptive meshes
Terzopoulos, D.   Vasilescu, M.  
Dept. of Comput. Sci., Toronto Univ., Ont.;

This paper appears in: Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Publication Date: 3-6 Jun 1991
On page(s): 70-75
Meeting Date: 06/03/1991 - 06/06/1991
Location: Maui, HI, USA
ISBN: 0-8186-2148-6
References Cited: 13
INSPEC Accession Number: 4127701
Digital Object Identifier: 10.1109/CVPR.1991.139663
Current Version Published: 2002-08-06

Abstract
An approach to visual sampling and reconstruction motivated by concepts from numerical grid generation is presented. Adaptive meshes that can nonuniformly sample and reconstruct intensity and range data are presented. These meshes are dynamic models which are assembled by interconnecting nodal masses with adjustable springs. Acting as mobile sampling sites, the nodes observe properties of the input data, such as intensities, depths, gradients, and curvatures. Based on these nodal observations, the springs automatically adjust their stiffnesses so as to distribute the available degrees of freedom of the reconstructed model in accordance with the local complexity of the input data. The adaptive mesh algorithm runs at interactive rates with continuous 3-D display on a graphics workstation It is applied to the adaptive sampling and reconstruction of images and surfaces

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (536 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved