Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

What's in a set of points? [straight line fitting]
Kiryati, N.   Bruckstein, A.M.  
Technion, Haifa;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Apr 1992
Volume: 14,  Issue: 4
On page(s): 496-500
ISSN: 0162-8828
References Cited: 20
CODEN: ITPIDJ
INSPEC Accession Number: 4166332
Digital Object Identifier: 10.1109/34.126810
Current Version Published: 2002-08-06

Abstract
The problem of fitting a straight line to a planar set of points is reconsidered. A parameter space computational approach capable of fitting one or more lines to a set of points is presented. The suggested algorithm handles errors in both coordinates of the data points, even when the error variances vary between coordinates and among points and can be readily made robust to outliers. The algorithm is quite general and allows line fitting according to several useful optimality criteria to be performed within a single computational framework. It is observed that certain extensions of the Hough transform can be turned to be equivalent to well-known M estimators, thus allowing computationally efficient approximate M estimation

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (400 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved