Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Constrained restoration and the recovery of discontinuities
Geman, D.   Reynolds, G.  
Dept. of Math. & Stat., Massachusetts Univ., Amherst, MA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Mar 1992
Volume: 14,  Issue: 3
On page(s): 367-383
ISSN: 0162-8828
References Cited: 30
CODEN: ITPIDJ
INSPEC Accession Number: 4151468
Digital Object Identifier: 10.1109/34.120331
Current Version Published: 2002-08-06

Abstract
The linear image restoration problem is to recover an original brightness distribution X0 given the blurred and noisy observations Y=KX0+B, where K and B represent the point spread function and measurement error, respectively. This problem is typical of ill-conditioned inverse problems that frequently arise in low-level computer vision. A conventional method to stabilize the problem is to introduce a priori constraints on X0 and design a cost functional H(X) over images X, which is a weighted average of the prior constraints (regularization term) and posterior constraints (data term); the reconstruction is then the image X, which minimizes H. A prominent weakness in this approach, especially with quadratic-type stabilizers, is the difficulty in recovering discontinuities. The authors therefore examine prior smoothness constraints of a different form, which permit the recovery of discontinuities without introducing auxiliary variables for marking the location of jumps and suspending the constraints in their vicinity. In this sense, discontinuities are addressed implicitly rather than explicitly

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1784 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved