Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Improving DC coding models of JPEG arithmetic coder
Lakhani, G.  
Texas Tech Univ., Lubbock, TX, USA;

This paper appears in: Signal Processing Letters, IEEE
Publication Date: May 2004
Volume: 11,  Issue: 5
On page(s): 505- 508
ISSN: 1070-9908
INSPEC Accession Number: 7948595
Digital Object Identifier: 10.1109/LSP.2004.826643
Current Version Published: 2004-04-19

Abstract
While conducting experiments with JPEG binary arithmetic coding, we noticed that if a natural photographic image is rotated by 90° and then coded, the DC code size is reduced in general. This led us to investigate the discrete cosine transform and statistical models of JPEG arithmetic coder, and formulate two modifications to DC coefficient coding. We propose that the DC of a block should be predicted from the block just above. This modification reduces the DC code size further by about 9% on average. This change is more important for arithmetic coding than Huffman DC coding. We also propose a change in the binary decision coding order specified by the DC statistical model; it produces only a minor reduction in the code size.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (144 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved