Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Calculating Dempster-Shafer plausibility
Barnett, J.A.  
Northrop Res. & Technol. Center, Palos Verdes Peninsula, CA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jun 1991
Volume: 13,  Issue: 6
On page(s): 599-602
ISSN: 0162-8828
References Cited: 8
CODEN: ITPIDJ
INSPEC Accession Number: 3980867
Digital Object Identifier: 10.1109/34.87345
Current Version Published: 2002-08-06

Abstract
A sufficient condition for the equality of the plausibility and commonality measures of the Dempster-Shafer belief calculus is developed. When the condition is met, an efficient method to calculate relative plausibility is available. In particular, the method can be used to calculate the relative plausibility of atomic hypotheses and, therefore, it can be used to find the choice that maximizes this measure. The computation is efficient enough to make Dempster-Shafer practical in some domains where computational complexity would otherwise discourage its use

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (380 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved