Constraining object features using a polarization reflectance model
Wolff, L.B.
Boult, T.E.
Columbia Univ., New York, NY;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jul 1991
Volume: 13,
Issue: 7
On page(s): 635-657
ISSN: 0162-8828
References Cited: 42
CODEN: ITPIDJ
INSPEC Accession Number: 4026731
Digital Object Identifier: 10.1109/34.85655
Current Version Published: 2002-08-06
Abstract
The authors present a polarization reflectance model that uses the
Fresnel reflection coefficients. This reflectance model accurately
predicts the magnitudes of polarization components of reflected light,
and all the polarization-based methods presented follow from this model.
The authors demonstrate the capability of polarization-based methods to
segment material surfaces according to varying levels of relative
electrical conductivity, in particular distinguishing dielectrics, which
are nonconducting, and metals, which are highly conductive.
Polarization-based methods can provide cues for distinguishing different
intensity-edge types arising from intrinsic light-dark or color
variations, intensity edges caused by specularities, and intensity edges
caused by occluding contours where the viewing direction becomes nearly
orthogonal to surface normals. Analysis of reflected polarization
components is also shown to enable the separation of diffuse and
specular components of reflection, unobscuring intrinsic surface detail
saturated by specular glare. Polarization-based methods used for
constraining surface normals are discussed
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