Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Surface reflection: physical and geometrical perspectives
Nayar, S.K.   Ikeuchi, K.   Kanade, T.  
Dept. of Comput. Sci., Columbia Univ., New York, NY;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jul 1991
Volume: 13,  Issue: 7
On page(s): 611-634
ISSN: 0162-8828
References Cited: 40
CODEN: ITPIDJ
INSPEC Accession Number: 4026730
Digital Object Identifier: 10.1109/34.85654
Current Version Published: 2002-08-06

Abstract
Reflectance models based on physical optics and geometrical optics are studied. Specifically, the authors consider the Beckmann-Spizzichino (physical optics) model and the Torrance-Sparrow (geometrical optics) model. These two models were chosen because they have been reported to fit experimental data well. Each model is described in detail, and the conditions that determine the validity of the model are clearly stated. By studying reflectance curves predicted by the two models, the authors propose a reflectance framework comprising three components: the diffuse lobe, the specular lobe, and the specular spike. The effects of surface roughness on the three primary components are analyzed in detail

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1884 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved