Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Features for neural net based region identification of newspaper documents
Andersen, T.   Wei Zhang  
Comput. Sci. Dept., Boise State Univ., ID, USA;

This paper appears in: Document Analysis and Recognition, 2003. Proceedings. Seventh International Conference on
Publication Date: 3-6 Aug. 2003
On page(s): 403- 407 vol.1
ISSN:
ISBN: 0-7695-1960-1
INSPEC Accession Number: 7839364
Digital Object Identifier: 10.1109/ICDAR.2003.1227698
Current Version Published: 2003-09-08

Abstract
Several features for neural network based document region identification are tested. Specifically, this paper examines features for non-text region identification. The neural network based region identification algorithm is a key component of a document recognition system that segments a document into regions, classifies them into text, graphic, photo, and other region types, and then uses this classification to guide the processing and analysis of the image. The input data are unusually challenging: low quality images of newspaper documents obtained from microfilmed archives. The results compare favorably with other results reported in the literature.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (213 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved