Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Evidential reasoning for object recognition
Binford, T.O.   Levitt, T.S.  
Read-Ink Corp., Cupertino, CA, USA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: July 2003
Volume: 25,  Issue: 7
On page(s): 837- 851
ISSN: 0162-8828
INSPEC Accession Number: 7701398
Digital Object Identifier: 10.1109/TPAMI.2003.1206513
Current Version Published: 2003-06-20

Abstract
The authors present a framework to guide development of evidential reasoning in object recognition systems. Principles of evidential reasoning processes for open-world object recognition are proposed and applied to build evidential reasoning capabilities. The principles summarize research and findings by the authors up through the mid-1990s, including seminal results in object-centered computer vision, figure-ground discrimination, and the application of hierarchical Bayesian inference, Bayesian networks, and decision graphs to evidential reasoning for object recognition.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (5790 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved