Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Pitfalls and paths to success in interdisciplinary scientific database research
Carlis, J.V.  
Comput. Sci. & Eng. Dept., Minnesota Univ., Minneapolis, MN, USA;

This paper appears in: Engineering in Medicine and Biology Magazine, IEEE
Publication Date: Nov.-Dec. 2002
Volume: 21,  Issue: 6
On page(s): 117-122
ISSN: 0739-5175
INSPEC Accession Number: 7524334
Digital Object Identifier: 10.1109/MEMB.2002.1175147
Current Version Published: 2003-03-20

Abstract
The challenges of interdisciplinary research are often alluded to but seldom talked about directly. Focusing on interdisciplinary research conducted by biologists and computer scientists, my intent in this article is to present for your consideration thoughts emerging out of my experiences with the hope that you can avoid pitfalls and choose paths that lead to success. Ten real pitfalls in interdisciplinary research are described in the form of painful questions, and some possible paths around them suggested. The first seven are largely about data, while the remaining three are about people. Successfully managing a flood of data with a DBMS leads biologists to perform lots of analyses. But that leads to them being overwhelmed by too many results. Biologists and computer scientists could be mismatched in several ways, each of which causes frustration. However, I have found that we have much in common and really are not isolated islands, or two cultures. As I step back and extract what I have learned, my main conclusion is this: while researchers face formidable scientific and computational tasks, the truly hard part is communicating.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (323 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved