Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

On three-dimensional surface reconstruction methods
Bolle, R.M.   Vemuri, B.C.  
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jan 1991
Volume: 13,  Issue: 1
On page(s): 1-13
ISSN: 0162-8828
References Cited: 91
CODEN: ITPIDJ
INSPEC Accession Number: 3880511
Digital Object Identifier: 10.1109/34.67626
Current Version Published: 2002-08-06

Abstract
A survey is presented of some of the surface reconstruction methods that can be found in the literature; the focus is on a small, recent, and important subset of the published reconstruction techniques. The techniques are classified based on the surface representation used, implicit versus explicit functions. A study is made of the important aspects of the surface reconstruction techniques. One aspect is the viewpoint invariance of the methods. This is an important property if object recognition is the ultimate objective. The robustness of the various methods is examined. It is determined whether the parameter estimates are biased, and the sensitivity to obscuration is addressed. The latter two aspects are particularly important for fitting functions in the implicit form. A detailed description is given of a parametric reconstruction method for three-dimensional object surfaces that involves numeric grid generation techniques and variational principle formulations. This technique is invariant to rigid motion in dimensional space

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1428 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved