Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Automatic and interactive modeling of buildings in urban environments from aerial images
Nevatia, R.   Price, K.  
Inst. for Robotics & Intelligent Syst., Univ. of Southern California, Los Angeles, CA, USA;

This paper appears in: Image Processing. 2002. Proceedings. 2002 International Conference on
Publication Date: 24-28 June 2002
Volume: 3,  On page(s): 525- 528 vol.3
ISSN: 1522-4880
ISBN: 0-7803-7622-6
INSPEC Accession Number: 7614177
Digital Object Identifier: 10.1109/ICIP.2002.1039023
Current Version Published: 2002-12-10

Abstract
Automatically extracting object models from images is a complex task. We describe research in extracting 3D models of buildings from aerial images. This work has resulted in several related systems including assisted extraction (minimal manual interaction to guide automatic processing), automatic extraction with limited imagery and limited building models, and automatic extraction with very good imagery and digital elevation models and more complex building models. Some results are provided for the assisted system and one of the automatic systems.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (389 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved