Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Perceptual watermarking of non i.i.d. signals based on wide spread spectrum using side information
Le Guelvouit, G.   Pateux, S.   Guillemot, C.  
IRISA/INRIA, France;

This paper appears in: Image Processing. 2002. Proceedings. 2002 International Conference on
Publication Date: 2002
Volume: 3,  On page(s): III-477- III-480 vol.3
ISSN: 1522-4880
ISBN: 0-7803-7622-6
INSPEC Accession Number: 7603817
Digital Object Identifier: 10.1109/ICIP.2002.1039011
Current Version Published: 2002-12-10

Abstract
The theoretical foundations of data hiding have been revealed by formulating the problem as message communication over a noisy channel, i.e. the host document. In light of this definition, some solutions have been proposed. Unfortunately, the performances of those methods are limited due to interference with the host signal. Considering spread spectrum information hiding with non i.i.d. Gaussian host signals and weighted distortion measures, we propose a game-theoretic resolution of the problem using side information.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (312 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved