On image analysis by the methods of moments
Teh, C.-H.
Chin, R.T.
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jul 1988
Volume: 10,
Issue: 4
On page(s): 496-513
ISSN: 0162-8828
References Cited: 21
CODEN: ITPIDJ
INSPEC Accession Number: 3233334
Digital Object Identifier: 10.1109/34.3913
Current Version Published: 2002-08-06
Abstract
Various types of moments have been used to recognize image
patterns in a number of applications. A number of moments are evaluated
and some fundamental questions are addressed, such as
image-representation ability, noise sensitivity, and information
redundancy. Moments considered include regular moments, Legendre
moments, Zernike moments, pseudo-Zernike moments, rotational moments,
and complex moments. Properties of these moments are examined in detail
and the interrelationships among them are discussed. Both theoretical
and experimental results are presented
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