Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Reduction of obscuration noise using multiple images
Nomura, Y.   Naruse, H.  
Electr. Commun. Labs., NTT, Ibaraki;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Mar 1988
Volume: 10,  Issue: 2
On page(s): 267-270
ISSN: 0162-8828
References Cited: 11
CODEN: ITPIDJ
INSPEC Accession Number: 3152852
Digital Object Identifier: 10.1109/34.3888
Current Version Published: 2002-08-06

Abstract
Noise that replaces, rather than perturbs, a signal is not amenable to the usual approaches of noise removal. Here, multiple images of a stationary scene are used to reduce random obscuration or dropout noise by the following method. For each image coordinate, a gray-level initial histogram is computed over all the images. The initial histograms are averaged for all image coordinates, and for each image coordinate a gray-level histogram corresponding to the object is derived by subtracting the averaged histogram from the initial one. The gray level of the object is obtained from the resulting object histogram. The effectiveness of this method is confirmed through experiments using a scene obscured by air bubbles in a water tank

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (560 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved