Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Learning gender with support faces
Moghaddam, B.   Ming-Hsuan Yang  
Mitsubishi Electr. Res. Labs., Cambridge, MA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: May 2002
Volume: 24,  Issue: 5
On page(s): 707-711
ISSN: 0162-8828
References Cited: 31
CODEN: ITPIDJ
INSPEC Accession Number: 7265320
Digital Object Identifier: 10.1109/34.1000244
Current Version Published: 2002-08-07

Abstract
Nonlinear support vector machines (SVMs) are investigated for appearance-based gender classification with low-resolution "thumbnail" faces processed from 1,755 images from the FERET (FacE REcognition Technology) face database. The performance of SVMs (3.4% error) is shown to be superior to traditional pattern classifiers (linear, quadratic, Fisher linear discriminant, nearest-neighbor) as well as more modern techniques, such as radial basis function (RBF) classifiers and large ensemble-RBF networks. Furthermore, the difference in classification performance with low-resolution "thumbnails" (21×12 pixels) and the corresponding higher-resolution images (84×48 pixels) was found to be only 1%, thus demonstrating robustness and stability with respect to scale and the degree of facial detail

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (697 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved