Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Instant dehazing of images using polarization
Schechner, Y.Y.   Narasimhan, S.G.   Nayar, S.K.  
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA;

This paper appears in: Computer Vision and Pattern Recognition, 2001. CVPR 2001. Proceedings of the 2001 IEEE Computer Society Conference on
Publication Date: 2001
Volume: 1,  On page(s): I-325- I-332 vol.1
ISSN: 1063-6919
ISBN: 0-7695-1272-0
INSPEC Accession Number: 7176882
Digital Object Identifier: 10.1109/CVPR.2001.990493
Current Version Published: 2003-04-15

Abstract
We present an approach to easily remove the effects of haze from images. It is based on the fact that usually airlight scattered by atmospheric particles is partially polarized. Polarization filtering alone cannot remove the haze effects, except in restricted situations. Our method, however, works under a wide range of atmospheric and viewing conditions. We analyze the image formation process, taking into account polarization effects of atmospheric scattering. We then invert the process to enable the removal of haze from images. The method can be used with as few as two images taken through a polarizer at different orientations. This method works instantly, without relying on changes of weather conditions. We present experimental results of complete dehazing in far from ideal conditions for polarization filtering. We obtain a great improvement of scene contrast and correction of color. As a by product, the method also yields a range (depth) map of the scene, and information about properties of the atmospheric particles.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1091 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved