Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Speaker adaptation in a large-vocabulary Gaussian HMM recognizer
Kenny, P.   Lennig, M.   Mermelstein, P.  
INRS-Telecommun., Montreal, Que.;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Sep 1990
Volume: 12,  Issue: 9
On page(s): 917-920
ISSN: 0162-8828
References Cited: 12
CODEN: ITPIDJ
INSPEC Accession Number: 3758656
Digital Object Identifier: 10.1109/34.57686
Current Version Published: 2002-08-06

Abstract
The problem of using a small amount of speech data to adapt a set of Gaussian HMMs (hidden Markov models) that have been trained on one speaker to recognize the speech of another is considered. The authors experimented with a phoneme-dependent spectral mapping for adapting the mean vectors of the multivariate Gaussian distributions (a method analogous to the confusion matrix method that has been used to adapt discrete HMMs), and a heuristic for estimating covariance matrices from small amounts of data. The best results were obtained by training the mean vectors individually from the adaptation data and using the heuristic to estimate distinct covariance matrices for each phoneme

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (436 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved