Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

An automated tactile sensing strategy for planar object recognitionand localization
Schneiter, J.L.   Sheridan, T.B.  
General Electric Corp., Schenectady, NY;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Aug 1990
Volume: 12,  Issue: 8
On page(s): 775-786
ISSN: 0162-8828
References Cited: 39
CODEN: ITPIDJ
INSPEC Accession Number: 3746882
Digital Object Identifier: 10.1109/34.57668
Current Version Published: 2002-08-06

Abstract
The planning problem associated with tactile exploration for object recognition and localization is addressed. Given that an object has been sensed and is one of a number of modeled objects, and given that the data obtained so far are insufficient for recognition and/or localization, the methods developed determin the paths along which a point contact sensor must be directed in order to obtain further highly diagnostic measurements. Three families of sensor paths are found. The first is the family of paths for which recognition and localization are guaranteed. The second guarantees only that something will be learned. The third represents paths to avoid because nothing new will be learned. The methods are based on a small but powerful set of geometric ideas and are developed for two-dimensional, planar-faced objects. They are conceptually easily generalized to handle three-dimensional objects, including objects with through holes

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1172 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved