Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A self-referencing level-set method for image reconstruction fromsparse Fourier samples
Jong Chul Ye   Bresler, Y.   Moulin, P.  
Coordinated Sci. Lab., Illinois Univ., Urbana, IL ;

This paper appears in: Image Processing, 2001. Proceedings. 2001 International Conference on
Publication Date: 7-10 Oct 2001
Volume: 2,  On page(s): 33-36 vol.2
Meeting Date: 10/07/2001 - 10/10/2001
Location: Thessaloniki, Greece
ISBN: 0-7803-6725-1
References Cited: 8
INSPEC Accession Number: 7219449
Digital Object Identifier: 10.1109/ICIP.2001.958417
Current Version Published: 2002-08-07

Abstract
We address image estimation from sparse Fourier samples. The problem is formulated as joint estimation of the supports of unknown sparse objects in the image, and pixel values on these supports. The domain and the pixel values are alternately estimated using the level-set method and the conjugate gradient method, respectively. Our level-set evolution shows a unique switching behavior, which stabilizes the level-set evolution and removes the re-initialization steps in conventional level set approaches

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (360 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved