Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A systematic design procedure for scalable near-circular Gaussianoperators
Scotney, B.W.   Coleman, S.A.   Herron, M.G.  
Ulster Univ., Coleraine;

This paper appears in: Image Processing, 2001. Proceedings. 2001 International Conference on
Publication Date: 2001
Volume: 3,  On page(s): 844-847 vol.3
Meeting Date: 10/07/2001 - 10/10/2001
Location: Thessaloniki, Greece
ISBN: 0-7803-6725-1
References Cited: 12
INSPEC Accession Number: 7230939
Digital Object Identifier: 10.1109/ICIP.2001.958252
Current Version Published: 2002-08-07

Abstract
In image filtering, the 'circularity' of an operator is an important factor affecting its accuracy. For example, circular differential edge operators are effective in minimising the angular error in the estimation of image gradient direction. We present a general approach to the computation of scalable circular low-level image processing operators that is based on the finite element method. We show that the use of Gaussian basis functions within the finite element method provides a framework for a systematic and efficient design procedure for operators that are scalable to near-circular neighbourhoods through the use of an explicit scale parameter. The general design technique may be applied to a range of operators. Here we evaluate the approach for the design of an image gradient operator, and we present comparative results with other gradient approximation methods

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (336 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved