Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Modified matched filter for cloud clutter suppression
Schmidt, W.A.C.  
US Naval Air Dev. Center, Warminster, PA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jun 1990
Volume: 12,  Issue: 6
On page(s): 594-600
ISSN: 0162-8828
References Cited: 5
CODEN: ITPIDJ
INSPEC Accession Number: 3724668
Digital Object Identifier: 10.1109/34.56196
Current Version Published: 2002-08-06

Abstract
The least-mean-square (LMS) filter has been developed as an alternative to the classical matched filter (MF) to address the clutter-spectrum issue. However, the output of the MF and the LMS processes is dependent on the scene energy and marginally dependent on the filter signal shape. An approach referred to as the modified matched filter (MMF) is presented. The MMF is a product of the LMS filter and a nonlinear operator known as the inverse Euclidean distance. The nonlinear operator modifies the LMS filter to improve its sensitivity to signal shape. A comparison indicates the relative merit of including shape detection in the LMS clutter-suppression process. Infrared cloud scenes from the background measurements and analysis program (BMAP) were used to demonstrate the relative clutter-suppression performance for both the LMS and the MMF processes. A performance metric is developed to measure cloud clutter suppression quantitatively

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (508 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved