Image seaming for segmentation on parallel architecture
Chen, M.-H.
Pavlidis, T.
State Univ. of New York, Stony Brook, NY;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jun 1990
Volume: 12,
Issue: 6
On page(s): 588-594
ISSN: 0162-8828
References Cited: 12
CODEN: ITPIDJ
INSPEC Accession Number: 3724667
Digital Object Identifier: 10.1109/34.56195
Current Version Published: 2002-08-06
Abstract
Some basic problems encountered when assembling the results of
image analysis on architectures with coarse parallelism are discussed.
The emphasis is on strategies that minimize the distortion in the final
result caused by processing image tiles independently. Methods are
presented that can be used to reduce the disparity between the results
of processing each title independently and processing each as part of a
whole image. A seaming algorithm has been constructed to seam the tiles
with the results of region segmentation using the gray-level mean
difference or maximum-minimum criteria. Experimental results, obtained
on a Sequent machine and a Sun 3/160 workstation, are given to
illustrate the performance of the algorithm
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
Cart
