Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

AC voltage-biased superconducting bolometer for a frequency-domainSQUID multiplexer
Yoon, J.   Clarke, J.   Gildemeister, J.M.   Lee, A.T.   Richards, P.L.  
Dept. of Phys., California Univ., Berkeley, CA ;

This paper appears in: Applied Superconductivity, IEEE Transactions on
Publication Date: Mar 2001
Volume: 11,  Issue: 1, Part 1
On page(s): 562-565
Meeting Date: 09/17/2000 - 09/22/2000
Location: Virginia Beach, VA, USA
ISSN: 1051-8223
References Cited: 11
CODEN: ITASE9
INSPEC Accession Number: 6942854
Digital Object Identifier: 10.1109/77.919407
Current Version Published: 2002-08-07

Abstract
We demonstrate that a voltage-biased superconducting bolometer (VSB), read out with superconducting quantum interference device (SQUID), can be biased with a sinusoidal voltage. We show that the load curves taken with AC- and DC-bias are nearly identical indicating that there is no identifiable degradation in the performance of the bolometer due to the AC bias. We discuss the use of a frequency-domain SQUID multiplexer with an array of VSB's that are AC-biased

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (316 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved