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Probe station testing of large area silicon drift detectors
Asmus, A. Bellwied, R. Beuttenmuller, R. Chen, W. Dyke, H. Eremin, V. Fiske, D.R. Hoffmann, G.W. Humanic, T.J. Grau, M. Ilyashenko, I. Kotov, I.V. Kraner, H.W. Leonhardt, B. Li, Z. Lynn, D. Pandey, S.U. Schambach, J. Sedlmeir, J. Sugarbaker, E. Takahashi, J.
STAR-SVT Collaboration, Brookhaven Nat. Lab., Upton, NY;

This paper appears in: Nuclear Science, IEEE Transactions on
Publication Date: Aug 2000
Volume: 47, Issue: 4, Part 1
On page(s): 1375-1380
Meeting Date: 10/24/1999 - 10/30/1999
Location: Seattle, WA, USA
ISSN: 0018-9499
References Cited: 13
CODEN: IETNAE
INSPEC Accession Number: 6738539
Digital Object Identifier: 10.1109/23.872981
Current Version Published: 2002-08-06

Abstract
Probe stations for STAR Si drift detectors testing were developed and built at BNT and Ohio State University. A throughput of a wafer per day per probe station was reached. The testing procedure and probe station design criteria are discussed

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