Fitting superellipses
Rosin, P.L.
Dept. of Comput. Sci., Cardiff Univ.;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Jul 2000
Volume: 22,
Issue: 7
On page(s): 726-732
ISSN: 0162-8828
References Cited: 20
CODEN: ITPIDJ
INSPEC Accession Number: 6718571
Digital Object Identifier: 10.1109/34.865190
Current Version Published: 2002-08-06
Abstract
In the literature, methods for fitting superellipses to data tend
to be computationally expensive due to the nonlinear nature of the
problem. This paper describes and tests several fitting techniques which
provide different trade-offs between efficiency and accuracy. In
addition, we describe various alternative error of fit measures that can
be applied by most superellipse fitting methods
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
Cart
