Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Parametrically deformable contour models
Staib, L.H.   Duncan, J.S.  
Dept. of Electr. Eng., Yale Univ., New Haven, CT ;

This paper appears in: Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Publication Date: 4-8 Jun 1989
On page(s): 98-103
Meeting Date: 06/04/1989 - 06/08/1989
Location: San Diego, CA, USA
ISBN: 0-8186-1952-x
References Cited: 12
INSPEC Accession Number: 3471657
Digital Object Identifier: 10.1109/CVPR.1989.37834
Current Version Published: 2002-08-06

Abstract
Segmentation using boundary finding is enhanced both by considering the boundary as a whole and by using model-based shape information. Flexible constraints, in the form of a probabilistic deformable model, are applied to the problem of segmenting natural objects whose diversity and irregularity of shape makes them poorly represented in terms of fixed features of forms. The parametric model is based on the elliptic Fourier decomposition of the boundary. The segmentation problem is solved as an optimization problem, where the best match between the boundary (as defined by the parameter vector) and the image data is found. Initial experimentation shows good results on a variety of images

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (380 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved