Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Optimal structure from motion: local ambiguities and globalestimates
Soatto, S.   Brockett, R.  
Washington Univ., St. Louis, MO;

This paper appears in: Computer Vision and Pattern Recognition, 1998. Proceedings. 1998 IEEE Computer Society Conference on
Publication Date: 23-25 Jun 1998
On page(s): 282-288
Meeting Date: 06/23/1998 - 06/25/1998
Location: Santa Barbara, CA, USA
ISSN: 1063-6919
ISBN: 0-8186-8497-6
References Cited: 20
INSPEC Accession Number: 5985857
Digital Object Identifier: 10.1109/CVPR.1998.698621
Current Version Published: 2002-08-06

Abstract
We present an analysis of SFM from the point of view of noise. This analysis results in an algorithm that is provably convergent and provably optimal with respect to a chosen norm. In particular, we cast SFM as a nonlinear optimization problem and define a bilinear projection iteration that converges to fixed points of a certain cost-function. We then show that such fixed points are “fundamental”, i.e. intrinsic to the problem of SFM and not an artifact introduced by our algorithm. We classify and characterize geometrically local extrema, and we argue that they correspond to phenomena observed in visual psychophysics. Finally, we show under what conditions it is possible-given convergence to a local extremum-to “jump” to the valley containing the optimum; this leads us to suggest a representation of the scene which is invariant with respect to such local extrema

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (512 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved