Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Invariant properties of straight homogeneous generalized cylindersand their contours
Ponce, J.   Chelberg, D.   Mann, W.B.  
Robotics Lab., Stanford Univ., CA;

This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Sep 1989
Volume: 11,  Issue: 9
On page(s): 951-966
ISSN: 0162-8828
References Cited: 37
CODEN: ITPIDJ
INSPEC Accession Number: 3509341
Digital Object Identifier: 10.1109/34.35498
Current Version Published: 2002-08-06

Abstract
A fundamental group in computer vision is the recovery of three-dimensional shape from image data. While this problem is in general underconstrained, the authors show that it can be simplified in the case where the objects being viewed are generalized cylinders. They consider the class of straight homogeneous generalized cylinders (SHGCs), without any further assumption on the viewing direction or the precise shape of these objects. They present a rigorous mathematical study of the geometry of SHGCs and characterize their Gaussian curvature and occluding contours, and use these results to prove several new invariant properties of the contours of SHGCs. These properties are, in turn, used in two implemented algorithms for recovering SHGC descriptions from image contours. Several examples of segmentation of real images are given. Other applications are also discussed

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1376 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved