On combining classifiers
Kittler, J.
Hatef, M.
Duin, R.P.W.
Matas, J.
Sch. of Electron. Eng., Surrey Univ., Guildford ;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Mar 1998
Volume: 20,
Issue: 3
On page(s): 226-239
ISSN: 0162-8828
References Cited: 44
CODEN: ITPIDJ
INSPEC Accession Number: 5903426
Digital Object Identifier: 10.1109/34.667881
Current Version Published: 2002-08-06
Abstract
We develop a common theoretical framework for combining
classifiers which use distinct pattern representations and show that
many existing schemes can be considered as special cases of compound
classification where all the pattern representations are used jointly to
make a decision. An experimental comparison of various classifier
combination schemes demonstrates that the combination rule developed
under the most restrictive assumptions-the sum rule-outperforms other
classifier combinations schemes. A sensitivity analysis of the various
schemes to estimation errors is carried out to show that this finding
can be justified theoretically
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