Waveform digitizing at 500 MHz
Atiya, M.
Ito, M.
Haggerty, J.
Ng, C.
Sippach, F.W.
Brookhaven Nat. Lab., Upton, NY;
This paper appears in: Nuclear Science, IEEE Transactions on
Publication Date: Feb 1989
Volume: 36,
Issue: 1, Part 1
On page(s): 813-817
Meeting Date: 11/09/1988 - 11/11/1988
Location: Orlando, FL, USA
ISSN: 0018-9499
References Cited: 0
CODEN: IETNAE
INSPEC Accession Number: 3410152
Digital Object Identifier: 10.1109/23.34556
Current Version Published: 2002-08-06
Abstract
A description is given of Experiment E787 at Brookhaven National
Laboratory, which is designated to study the decay
K+→π+vv to a sensitivity of
2×10-10. The authors report on the design and
construction of over 200 channels of relatively low-cost solid-state
waveform digitizers. These transient digitizers are capable of detecting
the decay π →μvevv with 75% efficiency and of rejecting μ
evv decays
to a level of 10-4. The distinguishing features of the
digitizers are 8-bit dynamic range, 500-MHz sampling, zero suppression
on the fly, deep memory (up to 0.5 ms), and fast readout time (100 μs
for the entire system). Data obtained during the February-May 1988 run
are reported
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