Wavelet-based affine invariant representation: a tool forrecognizing planar objects in 3D space
Quang Minh Tieng
Boles, W.W.
Sch. of Electr. & Electron. Syst. Eng., Queensland Univ. of Technol., Brisbane, Qld.;
This paper appears in: Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publication Date: Aug 1997
Volume: 19,
Issue: 8
On page(s): 846-857
ISSN: 0162-8828
References Cited: 25
CODEN: ITPIDJ
INSPEC Accession Number: 5693725
Digital Object Identifier: 10.1109/34.608288
Current Version Published: 2002-08-06
Abstract
A technique is developed to construct a representation of planar
objects undergoing a general affine transformation. The representation
can be used to describe planar or nearly planar objects in a
three-dimensional space, observed by a camera under arbitrary
orientations. The technique is based upon object contours, parameterized
by an affine invariant parameter and the dyadic wavelet transform. The
role of the wavelet transform is the extraction of multiresolution
affine invariant features from the affine invariant contour
representation. A dissimilarity function is also developed and used to
distinguish among different object representations. This function makes
use of the extrema on the representations, thus making its computation
very efficient. A study of the effect of using different wavelet
functions and their order or vanishing moments is also carried out.
Experimental results show that the performance of the proposed
representation is better than that of other existing methods,
particularly when objects are heavily corrupted with noise
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