Object recognition using invariant profiles
Slater, D.
Healey, G.
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA;
This paper appears in: Computer Vision and Pattern Recognition, 1997. Proceedings., 1997 IEEE Computer Society Conference on
Publication Date: 17-19 Jun 1997
On page(s): 827-832
Meeting Date: 06/17/1997 - 06/19/1997
Location: San Juan, Puerto Rico
ISBN: 0-8186-7822-4
References Cited: 16
INSPEC Accession Number: 5644254
Digital Object Identifier: 10.1109/CVPR.1997.609423
Current Version Published: 2002-08-06
Abstract
We derive a sensitivity analysis for moment invariants of
multidimensional distributions. These invariants have many uses in
computational systems and have recently been used for
illumination-invariant recognition in color images. In this context, the
sensitivity analysis predicts the response of moment invariants to
partial occlusion. Using the results of the sensitivity analysis, we
develop a novel surface representation called the invariant profile
which captures color distribution and spatial information while
remaining invariant to the spectral content of the scene illumination.
Unlike previous representations, the recognition of invariant profiles
does not require illumination correction. We demonstrate the sensitivity
analysis and the use of invariant profiles for recognition with a set of
experiments on color images
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