Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Space-time trellis codes for 4-PSK with three and four transmitantennas in quasi-static flat fading channels
Chen, Z.   Vucetic, B.S.   Yuan, J.   Ka Leong Lo  
Sch. of Electr. & Inf. Eng., Sydney Univ., NSW ;

This paper appears in: Communications Letters, IEEE
Publication Date: Feb 2002
Volume: 6,  Issue: 2
On page(s): 67-69
ISSN: 1089-7798
References Cited: 11
CODEN: ICLEF6
INSPEC Accession Number: 7192166
Digital Object Identifier: 10.1109/4234.984696
Current Version Published: 2002-08-07

Abstract
It has been established that the appropriate design parameters for space-time trellis code (STTC) in quasi-static flat Rayleigh fading channels are the rank and determinant criteria or the Euclidean distance criterion, depending on the value of the overall diversity gain. We propose two groups of new STTCs with more than two transmit antennas based on these two design criteria, respectively. These new STTCs are shown to achieve large performance improvements over the ones with two transmit antennas

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (94 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved