Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Compatible observability don't cares revisited
Brayton, R.K.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Publication Date: 2001
On page(s): 618-623
Meeting Date: 11/04/2001 - 11/08/2001
Location: San Jose, CA, USA
ISBN: 0-7803-7247-6
References Cited: 10
INSPEC Accession Number: 7219926
Digital Object Identifier: 10.1109/ICCAD.2001.968725
Current Version Published: 2002-08-07

Abstract
CODCs stands for compatible observability don't cares. We first examine the definition of compatibility and when a set of CODCs is compatible. We then discuss Savoj's CODC computation for propagating CODCs from a node's output to its fanins, and show by example, that the results can depend on the current implementation of the node. Then we generalize the computation so that the result is independent of the implementation at the node. The CODCs propagated by this computation are proved to be maximal in some sense. Local don't cares (LDCs) are CODCs of a node, pre-imaged to the primary inputs and then imaged and projected to the local fanins of the node. LDCs combine CODCs with SDCs (satisfiability don't cares), but only the CODC part is propagated to the fanin network. Another form of local don't cares, propagates both the CODC and SDC parts to the fanin network. Both are shown to be compatible in some sense, but conservative. We give a method for updating both kinds of local don't cares incrementally when other nodes in the network are changed

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (413 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved