Scaling trends of cosmic ray induced soft errors in static latchesbeyond 0.18 μ
Karnik, T.
Bloechel, B.
Soumyanath, K.
De, V.
Borkar, S.
Microprocessor Res. Labs., Intel Corp., Hillsboro, OR;
This paper appears in: VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on
Publication Date: 2001
On page(s): 61-62
Meeting Date: 06/14/2001 - 06/16/2001
Location: Kyoto, Japan
ISBN: 4-89114-014-3
References Cited: 3
INSPEC Accession Number: 7092020
Digital Object Identifier: 10.1109/VLSIC.2001.934195
Current Version Published: 2002-08-07
Abstract
This paper describes an experiment to characterize soft error rate
of static latches for neutrons using a neutron beam, with measured soft
error rates as a function of diffusion collection areas and supply
voltages. The paper also quantifies the effectiveness of two promising
hardening techniques and scaling trends
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