Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Understanding the plant level costs and benefits of ERP: will the ugly duckling always turn into a swan?
Gattiker, T.F.   Goodhue, D.L.  
Terry Coll. of Bus., Georgia Univ., Athens, GA, USA;

This paper appears in: System Sciences, 2000. Proceedings of the 33rd Annual Hawaii International Conference on
Publication Date: 4-7 Jan. 2000
On page(s): 10 pp. vol.1-
ISSN:
ISBN: 0-7695-0493-0
INSPEC Accession Number: 6551929
Current Version Published: 2002-08-06

Abstract
This paper explores the impact of enterprise resource planning (ERP) systems using the individual manufacturing facility as the level of analysis. A model of ERP costs and benefits based on organizational information processing theory is proposed. The model resolves some of the apparently contradictory ERP impacts that have been reported in the trade literature. The paper then describes ERP implementations in two plants. Organizational information processing theory explains many of the costs and benefits that were observed in the cases. The cases also revealed several unexpected insights. Based on the case study findings, the paper proposes a revised model of ERP impacts.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (80 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved