Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Efficiency performance, control charts, and process improvement:complementary measurement and evaluation
Hoopes, B.J.   Triantis, K.P.  
Dept. of Manage. Sci. & Inf. Technol., Virginia Polytech. Inst. & State Univ., Blacksburg, VA;

This paper appears in: Engineering Management, IEEE Transactions on
Publication Date: May 2001
Volume: 48,  Issue: 2
On page(s): 239-253
ISSN: 0018-9391
References Cited: 34
CODEN: IEEMA4
INSPEC Accession Number: 6934862
Digital Object Identifier: 10.1109/17.922481
Current Version Published: 2002-08-07

Abstract
Data envelopment analysis provides an assessment of the efficiency performance of production processes by including in its modeling framework technologically critical input/output variables. In order to create the conceptual linkage to traditional control charts, input/output production specifications may use the concepts of process and product characteristics. Process control charts track the variability and central tendency of production processes by studying the stochastic behavior of a single product characteristic. On the other hand, efficiency measurement approaches include, as part of their evaluation, the entire set of critical product and/or process characteristics simultaneously. This research shows that these two approaches can be used in a complementary manner to identify unusual or extreme production instances, benchmark production occurrences, and evaluate the contribution of individual process and product characteristics to the overall performance of the production process. The identification of extreme production instances in conjunction with the evaluation of their technological and managerial characteristics can help identify potential root causes. This information can be used by decision makers to make specific process improvements. These issues are illustrated by studying a production process of a circuit board manufacturing facility

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (388 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved