Efficiency performance, control charts, and process improvement:complementary measurement and evaluation
Hoopes, B.J.
Triantis, K.P.
Dept. of Manage. Sci. & Inf. Technol., Virginia Polytech. Inst. & State Univ., Blacksburg, VA;
This paper appears in: Engineering Management, IEEE Transactions on
Publication Date: May 2001
Volume: 48,
Issue: 2
On page(s): 239-253
ISSN: 0018-9391
References Cited: 34
CODEN: IEEMA4
INSPEC Accession Number: 6934862
Digital Object Identifier: 10.1109/17.922481
Current Version Published: 2002-08-07
Abstract
Data envelopment analysis provides an assessment of the efficiency
performance of production processes by including in its modeling
framework technologically critical input/output variables. In order to
create the conceptual linkage to traditional control charts,
input/output production specifications may use the concepts of process
and product characteristics. Process control charts track the
variability and central tendency of production processes by studying the
stochastic behavior of a single product characteristic. On the other
hand, efficiency measurement approaches include, as part of their
evaluation, the entire set of critical product and/or process
characteristics simultaneously. This research shows that these two
approaches can be used in a complementary manner to identify unusual or
extreme production instances, benchmark production occurrences, and
evaluate the contribution of individual process and product
characteristics to the overall performance of the production process.
The identification of extreme production instances in conjunction with
the evaluation of their technological and managerial characteristics can
help identify potential root causes. This information can be used by
decision makers to make specific process improvements. These issues are
illustrated by studying a production process of a circuit board
manufacturing facility
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.